Automated SEM-based nanoparticle metrology for materials characterization via segmentation and robust scale-bar recognition.

Huang X, Yin Y, Hu J, Yu W, Fang L, Liu J, Li D

DOI: 10.1039/d6ra02763f
Published: 2026 Aug 26
Container: RSC advances
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.1039/d6ra02763f,
  title = {Automated SEM-based nanoparticle metrology for materials characterization via segmentation and robust scale-bar recognition.},
  author = {Huang X and Yin Y and Hu J and Yu W and Fang L and Liu J and Li D},
  year = {2026},
  journal = {RSC advances},
  doi = {10.1039/d6ra02763f},
  url = {https://doi.org/10.1039/d6ra02763f}
}

RIS

TY  - JOUR
TI  - Automated SEM-based nanoparticle metrology for materials characterization via segmentation and robust scale-bar recognition.
AU  - Huang X
AU  - Yin Y
AU  - Hu J
AU  - Yu W
AU  - Fang L
AU  - Liu J
AU  - Li D
PY  - 2026
JO  - RSC advances
DO  - 10.1039/d6ra02763f
UR  - https://doi.org/10.1039/d6ra02763f
ER  -

APA

X, H., Y, Y., J, H., W, Y., L, F., J, L., & D, L. (2026). Automated SEM-based nanoparticle metrology for materials characterization via segmentation and robust scale-bar recognition.. RSC advances. https://doi.org/10.1039/d6ra02763f

Source records

pubmed · retrieved 2026-09-25T02:35:10.210Z