Electrical noise as a reliability indicator in electronic devices and components

B.K. Jones

Open source

DOI: 10.1049/ip-cds:20020331
Published: 2002-02-01
Container: IEE Proceedings - Circuits, Devices and Systems
Publisher: Institution of Engineering and Technology (IET)
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1049/ip-cds:20020331,
  title = {Electrical noise as a reliability indicator in electronic devices and components},
  author = {B.K. Jones},
  year = {2002},
  journal = {IEE Proceedings - Circuits, Devices and Systems},
  doi = {10.1049/ip-cds:20020331},
  url = {https://doi.org/10.1049/ip-cds:20020331}
}

RIS

TY  - JOUR
TI  - Electrical noise as a reliability indicator in electronic devices and components
AU  - B.K. Jones
PY  - 2002
JO  - IEE Proceedings - Circuits, Devices and Systems
DO  - 10.1049/ip-cds:20020331
UR  - https://doi.org/10.1049/ip-cds:20020331
ER  -

APA

Jones, B. (2002). Electrical noise as a reliability indicator in electronic devices and components. IEE Proceedings - Circuits, Devices and Systems. https://doi.org/10.1049/ip-cds:20020331

Source records

crossref · retrieved 2026-09-27T11:01:52.761Z