Texture analyses of chemically vapor deposited coatings in the Ti-C-N system by wide film Debye-Scherrer X-ray diffraction technique

S. EROGLU, B. GALLOIS

Open source

DOI: 10.1051/jp4:1993322
Published: 1993-08
Container: Le Journal de Physique IV
Publisher: EDP Sciences
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1051/jp4:1993322,
  title = {Texture analyses of chemically vapor deposited coatings in the Ti-C-N system by wide film Debye-Scherrer X-ray diffraction technique},
  author = {S. EROGLU and B. GALLOIS},
  year = {1993},
  journal = {Le Journal de Physique IV},
  doi = {10.1051/jp4:1993322},
  url = {https://doi.org/10.1051/jp4:1993322}
}

RIS

TY  - JOUR
TI  - Texture analyses of chemically vapor deposited coatings in the Ti-C-N system by wide film Debye-Scherrer X-ray diffraction technique
AU  - S. EROGLU
AU  - B. GALLOIS
PY  - 1993
JO  - Le Journal de Physique IV
DO  - 10.1051/jp4:1993322
UR  - https://doi.org/10.1051/jp4:1993322
ER  -

APA

EROGLU, S., & GALLOIS, B. (1993). Texture analyses of chemically vapor deposited coatings in the Ti-C-N system by wide film Debye-Scherrer X-ray diffraction technique. Le Journal de Physique IV. https://doi.org/10.1051/jp4:1993322

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crossref · retrieved 2026-11-08T03:11:27.926Z