Structural Characterization of Thin Films and Multilayer Structures

K. Temst, M. J. Van Bael, M. Baert, E. Rosseel, V. Bruyndoncx, C. Strunk, G. Verbanck, K. Mae, C. Van Haesendonck, V. V. Moshchalkov, Y. Bruynseraede, R. Jonckheere, D. G. de Groot, N. Koeman, R. Griessen

Open source

DOI: 10.1051/jp4:1996340
Published: 1996-04
Container: Le Journal de Physique IV
Publisher: EDP Sciences
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1051/jp4:1996340,
  title = {Structural Characterization of Thin Films and Multilayer Structures},
  author = {K. Temst and M. J. Van Bael and M. Baert and E. Rosseel and V. Bruyndoncx and C. Strunk and G. Verbanck and K. Mae and C. Van Haesendonck and V. V. Moshchalkov and Y. Bruynseraede and R. Jonckheere and D. G. de Groot and N. Koeman and R. Griessen},
  year = {1996},
  journal = {Le Journal de Physique IV},
  doi = {10.1051/jp4:1996340},
  url = {https://doi.org/10.1051/jp4:1996340}
}

RIS

TY  - JOUR
TI  - Structural Characterization of Thin Films and Multilayer Structures
AU  - K. Temst
AU  - M. J. Van Bael
AU  - M. Baert
AU  - E. Rosseel
AU  - V. Bruyndoncx
AU  - C. Strunk
AU  - G. Verbanck
AU  - K. Mae
AU  - C. Van Haesendonck
AU  - V. V. Moshchalkov
AU  - Y. Bruynseraede
AU  - R. Jonckheere
AU  - D. G. de Groot
AU  - N. Koeman
AU  - R. Griessen
PY  - 1996
JO  - Le Journal de Physique IV
DO  - 10.1051/jp4:1996340
UR  - https://doi.org/10.1051/jp4:1996340
ER  -

APA

Temst, K., Bael, M. J. V., Baert, M., Rosseel, E., Bruyndoncx, V., Strunk, C., Verbanck, G., Mae, K., Haesendonck, C. V., Moshchalkov, V. V., Bruynseraede, Y., Jonckheere, R., Groot, D. G. D., Koeman, N., & Griessen, R. (1996). Structural Characterization of Thin Films and Multilayer Structures. Le Journal de Physique IV. https://doi.org/10.1051/jp4:1996340

Source records

crossref · retrieved 2026-11-10T11:24:08.988Z