THE COMPLEMENTARY USE OF ATOM PROBE FIELD ION MICROSCOPY AND ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY FOR THE STUDY OF A Ni-BASE SUPERALLOY

A. J. Melmed, M. E. Twigg, R. Klein, M. J. Kaufman, H. L. Fraser

Open source

DOI: 10.1051/jphyscol:1984962
Published: 1984-12
Container: Le Journal de Physique Colloques
Publisher: EDP Sciences
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1051/jphyscol:1984962,
  title = {THE COMPLEMENTARY USE OF ATOM PROBE FIELD ION MICROSCOPY AND ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY FOR THE STUDY OF A Ni-BASE SUPERALLOY},
  author = {A. J. Melmed and M. E. Twigg and R. Klein and M. J. Kaufman and H. L. Fraser},
  year = {1984},
  journal = {Le Journal de Physique Colloques},
  doi = {10.1051/jphyscol:1984962},
  url = {https://doi.org/10.1051/jphyscol:1984962}
}

RIS

TY  - JOUR
TI  - THE COMPLEMENTARY USE OF ATOM PROBE FIELD ION MICROSCOPY AND ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY FOR THE STUDY OF A Ni-BASE SUPERALLOY
AU  - A. J. Melmed
AU  - M. E. Twigg
AU  - R. Klein
AU  - M. J. Kaufman
AU  - H. L. Fraser
PY  - 1984
JO  - Le Journal de Physique Colloques
DO  - 10.1051/jphyscol:1984962
UR  - https://doi.org/10.1051/jphyscol:1984962
ER  -

APA

Melmed, A. J., Twigg, M. E., Klein, R., Kaufman, M. J., & Fraser, H. L. (1984). THE COMPLEMENTARY USE OF ATOM PROBE FIELD ION MICROSCOPY AND ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY FOR THE STUDY OF A Ni-BASE SUPERALLOY. Le Journal de Physique Colloques. https://doi.org/10.1051/jphyscol:1984962

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crossref · retrieved 2026-09-24T21:49:21.715Z