Structural study of bismuth films and its consequences on their electrical properties

J. Buxo, M. Saleh, G. Sarrabayrouse, G. Dorville, J. Berty, M. Brieu

Open source

DOI: 10.1051/rphysap:01980001505096100
Published: 1980
Container: Revue de Physique Appliquée
Publisher: EDP Sciences
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1051/rphysap:01980001505096100,
  title = {Structural study of bismuth films and its consequences on their electrical properties},
  author = {J. Buxo and M. Saleh and G. Sarrabayrouse and G. Dorville and J. Berty and M. Brieu},
  year = {1980},
  journal = {Revue de Physique Appliquée},
  doi = {10.1051/rphysap:01980001505096100},
  url = {https://doi.org/10.1051/rphysap:01980001505096100}
}

RIS

TY  - JOUR
TI  - Structural study of bismuth films and its consequences on their electrical properties
AU  - J. Buxo
AU  - M. Saleh
AU  - G. Sarrabayrouse
AU  - G. Dorville
AU  - J. Berty
AU  - M. Brieu
PY  - 1980
JO  - Revue de Physique Appliquée
DO  - 10.1051/rphysap:01980001505096100
UR  - https://doi.org/10.1051/rphysap:01980001505096100
ER  -

APA

Buxo, J., Saleh, M., Sarrabayrouse, G., Dorville, G., Berty, J., & Brieu, M. (1980). Structural study of bismuth films and its consequences on their electrical properties. Revue de Physique Appliquée. https://doi.org/10.1051/rphysap:01980001505096100

Source records

crossref · retrieved 2026-09-26T06:34:49.042Z