Characterization of X-UV multilayers by grazing incidence X-ray reflectometry

L. Nevot, B. Pardo, J. Corno

Open source

DOI: 10.1051/rphysap:0198800230100167500
Published: 1988
Container: Revue de Physique Appliquée
Publisher: EDP Sciences
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1051/rphysap:0198800230100167500,
  title = {Characterization of X-UV multilayers by grazing incidence X-ray reflectometry},
  author = {L. Nevot and B. Pardo and J. Corno},
  year = {1988},
  journal = {Revue de Physique Appliquée},
  doi = {10.1051/rphysap:0198800230100167500},
  url = {https://doi.org/10.1051/rphysap:0198800230100167500}
}

RIS

TY  - JOUR
TI  - Characterization of X-UV multilayers by grazing incidence X-ray reflectometry
AU  - L. Nevot
AU  - B. Pardo
AU  - J. Corno
PY  - 1988
JO  - Revue de Physique Appliquée
DO  - 10.1051/rphysap:0198800230100167500
UR  - https://doi.org/10.1051/rphysap:0198800230100167500
ER  -

APA

Nevot, L., Pardo, B., & Corno, J. (1988). Characterization of X-UV multilayers by grazing incidence X-ray reflectometry. Revue de Physique Appliquée. https://doi.org/10.1051/rphysap:0198800230100167500

Source records

crossref · retrieved 2026-09-26T19:19:13.488Z