Polarity determination for GaN thin films by electron energy-loss spectroscopy

X. Kong, G. Q. Hu, X. F. Duan, Y. Lu, X. L. Liu

Open source

DOI
10.1063/1.1504876
Published
2002-09-09
Container
Applied Physics Letters
Publisher
AIP Publishing
Open access
unknown

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BibTeX

@article{allodium:10.1063/1.1504876,
  title = {Polarity determination for GaN thin films by electron energy-loss spectroscopy},
  author = {X. Kong and G. Q. Hu and X. F. Duan and Y. Lu and X. L. Liu},
  year = {2002},
  journal = {Applied Physics Letters},
  doi = {10.1063/1.1504876},
  url = {https://doi.org/10.1063/1.1504876}
}

RIS

TY  - JOUR
TI  - Polarity determination for GaN thin films by electron energy-loss spectroscopy
AU  - X. Kong
AU  - G. Q. Hu
AU  - X. F. Duan
AU  - Y. Lu
AU  - X. L. Liu
PY  - 2002
JO  - Applied Physics Letters
DO  - 10.1063/1.1504876
UR  - https://doi.org/10.1063/1.1504876
ER  - 

APA

Kong, X., Hu, G. Q., Duan, X. F., Lu, Y., & Liu, X. L. (2002). Polarity determination for GaN thin films by electron energy-loss spectroscopy. Applied Physics Letters. https://doi.org/10.1063/1.1504876

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