Oxide thickness dependence of swift heavy ion-induced surface tracks formation in silicon dioxide on silicon structures at grazing incidence
- DOI
- 10.1063/1.2826708
- Published
- 2007-12-15
- Container
- Journal of Applied Physics
- Publisher
- Not recorded
- Open access
- no
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Cite this work
BibTeX
@article{allodium:10.1063/1.2826708,
title = {Oxide thickness dependence of swift heavy ion-induced surface tracks formation in silicon dioxide on silicon structures at grazing incidence},
author = {A.M.J.F. Carvalho and Antoine Touboul and M. Marinoni and M. Ramonda and C. Guasch and Frédéric Saigné and J. Bonnet and J. Gasiot},
year = {2007},
journal = {Journal of Applied Physics},
doi = {10.1063/1.2826708},
url = {https://doi.org/10.1063/1.2826708}
}RIS
TY - JOUR TI - Oxide thickness dependence of swift heavy ion-induced surface tracks formation in silicon dioxide on silicon structures at grazing incidence AU - A.M.J.F. Carvalho AU - Antoine Touboul AU - M. Marinoni AU - M. Ramonda AU - C. Guasch AU - Frédéric Saigné AU - J. Bonnet AU - J. Gasiot PY - 2007 JO - Journal of Applied Physics DO - 10.1063/1.2826708 UR - https://doi.org/10.1063/1.2826708 ER -
APA
Carvalho, A., Touboul, A., Marinoni, M., Ramonda, M., Guasch, C., Saigné, F., Bonnet, J., & Gasiot, J. (2007). Oxide thickness dependence of swift heavy ion-induced surface tracks formation in silicon dioxide on silicon structures at grazing incidence. Journal of Applied Physics. https://doi.org/10.1063/1.2826708
Source records
- hal · retrieved 2026-09-26T10:27:04.052Z