Significant thickness dependence of the thermal resistance between few layer graphenes

Yuxiang Ni, Yann Chalopin, Sebastian Volz

Open source

DOI
10.1063/1.4818341
Published
2013-08-08
Container
Applied Physics Letters
Publisher
Not recorded
Open access
no

Credibility signals

limited evidence Score 43/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

Cite this work

BibTeX

@article{allodium:10.1063/1.4818341,
  title = {Significant thickness dependence of the thermal resistance between few layer graphenes},
  author = {Yuxiang Ni and Yann Chalopin and Sebastian Volz},
  year = {2013},
  journal = {Applied Physics Letters},
  doi = {10.1063/1.4818341},
  url = {https://doi.org/10.1063/1.4818341}
}

RIS

TY  - JOUR
TI  - Significant thickness dependence of the thermal resistance between few layer graphenes
AU  - Yuxiang Ni
AU  - Yann Chalopin
AU  - Sebastian Volz
PY  - 2013
JO  - Applied Physics Letters
DO  - 10.1063/1.4818341
UR  - https://doi.org/10.1063/1.4818341
ER  - 

APA

Ni, Y., Chalopin, Y., & Volz, S. (2013). Significant thickness dependence of the thermal resistance between few layer graphenes. Applied Physics Letters. https://doi.org/10.1063/1.4818341

Source records