Passive microrheology of soft materials with atomic force microscopy: A wavelet-based spectral analysis

C. Martinez-Torres, A. Arneodo, L. Streppa, P. Argoul, F. Argoul

Open source

DOI: 10.1063/1.4940220
Published: 2016-01-18
Container: Applied Physics Letters
Publisher: AIP Publishing
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1063/1.4940220,
  title = {Passive microrheology of soft materials with atomic force microscopy: A wavelet-based spectral analysis},
  author = {C. Martinez-Torres and A. Arneodo and L. Streppa and P. Argoul and F. Argoul},
  year = {2016},
  journal = {Applied Physics Letters},
  doi = {10.1063/1.4940220},
  url = {https://doi.org/10.1063/1.4940220}
}

RIS

TY  - JOUR
TI  - Passive microrheology of soft materials with atomic force microscopy: A wavelet-based spectral analysis
AU  - C. Martinez-Torres
AU  - A. Arneodo
AU  - L. Streppa
AU  - P. Argoul
AU  - F. Argoul
PY  - 2016
JO  - Applied Physics Letters
DO  - 10.1063/1.4940220
UR  - https://doi.org/10.1063/1.4940220
ER  -

APA

Martinez-Torres, C., Arneodo, A., Streppa, L., Argoul, P., & Argoul, F. (2016). Passive microrheology of soft materials with atomic force microscopy: A wavelet-based spectral analysis. Applied Physics Letters. https://doi.org/10.1063/1.4940220

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crossref · retrieved 2026-09-24T22:49:28.464Z