Scanning microwave microscopy applied to semiconducting GaAs structures.
- DOI
- 10.1063/1.5015966
- Published
- 2018 Feb
- Container
- The Review of scientific instruments
- Publisher
- Not recorded
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1063/1.5015966,
title = {Scanning microwave microscopy applied to semiconducting GaAs structures.},
author = {Buchter A and Hoffmann J and Delvallée A and Brinciotti E and Hapiuk D and Licitra C and Louarn K and Arnoult A and Almuneau G and Piquemal F and Zeier M and Kienberger F},
year = {2018},
journal = {The Review of scientific instruments},
doi = {10.1063/1.5015966},
url = {https://doi.org/10.1063/1.5015966}
}RIS
TY - JOUR TI - Scanning microwave microscopy applied to semiconducting GaAs structures. AU - Buchter A AU - Hoffmann J AU - Delvallée A AU - Brinciotti E AU - Hapiuk D AU - Licitra C AU - Louarn K AU - Arnoult A AU - Almuneau G AU - Piquemal F AU - Zeier M AU - Kienberger F PY - 2018 JO - The Review of scientific instruments DO - 10.1063/1.5015966 UR - https://doi.org/10.1063/1.5015966 ER -
APA
A, B., J, H., A, D., E, B., D, H., C, L., K, L., A, A., G, A., F, P., M, Z., & F, K. (2018). Scanning microwave microscopy applied to semiconducting GaAs structures.. The Review of scientific instruments. https://doi.org/10.1063/1.5015966
Source records
- pubmed · retrieved 2026-09-25T12:57:56.074Z