Barkhausen noise analysis of thin film ferroelectrics

Keisuke Yazawa, Benjamin Ducharne, Hiroshi Uchida, Hiroshi Funakubo, John Blendell

DOI: 10.1063/5.0012635
Published: 2020-07-06
Container: Applied Physics Letters
Publisher: Not recorded
Open access: no

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Cite this work

BibTeX

@article{allodium:10.1063/5.0012635,
  title = {Barkhausen noise analysis of thin film ferroelectrics},
  author = {Keisuke Yazawa and Benjamin Ducharne and Hiroshi Uchida and Hiroshi Funakubo and John Blendell},
  year = {2020},
  journal = {Applied Physics Letters},
  doi = {10.1063/5.0012635},
  url = {https://doi.org/10.1063/5.0012635}
}

RIS

TY  - JOUR
TI  - Barkhausen noise analysis of thin film ferroelectrics
AU  - Keisuke Yazawa
AU  - Benjamin Ducharne
AU  - Hiroshi Uchida
AU  - Hiroshi Funakubo
AU  - John Blendell
PY  - 2020
JO  - Applied Physics Letters
DO  - 10.1063/5.0012635
UR  - https://doi.org/10.1063/5.0012635
ER  -

APA

Yazawa, K., Ducharne, B., Uchida, H., Funakubo, H., & Blendell, J. (2020). Barkhausen noise analysis of thin film ferroelectrics. Applied Physics Letters. https://doi.org/10.1063/5.0012635

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hal · retrieved 2026-09-26T09:09:36.813Z