Simultaneous measurement of fine pattern shape and overall shape by a nano-profiler.

Miyawaki T, Endo K

Open source

DOI
10.1063/5.0118712
Published
2022 Dec 1
Container
The Review of scientific instruments
Publisher
Not recorded
Open access
unknown

Credibility signals

limited evidence Score 43/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

Cite this work

BibTeX

@article{allodium:10.1063/5.0118712,
  title = {Simultaneous measurement of fine pattern shape and overall shape by a nano-profiler.},
  author = {Miyawaki T and Endo K},
  year = {2022},
  journal = {The Review of scientific instruments},
  doi = {10.1063/5.0118712},
  url = {https://doi.org/10.1063/5.0118712}
}

RIS

TY  - JOUR
TI  - Simultaneous measurement of fine pattern shape and overall shape by a nano-profiler.
AU  - Miyawaki T
AU  - Endo K
PY  - 2022
JO  - The Review of scientific instruments
DO  - 10.1063/5.0118712
UR  - https://doi.org/10.1063/5.0118712
ER  - 

APA

T, M., & K, E. (2022). Simultaneous measurement of fine pattern shape and overall shape by a nano-profiler.. The Review of scientific instruments. https://doi.org/10.1063/5.0118712

Source records