Flexoelectricity-stabilized ferroelectric phase with enhanced reliability in ultrathin La:HfO2 films

Peijie Jiao, Hao Cheng, Jiayi Li, Hongying Chen, Zhiyu Liu, Zhongnan Xi, Wenjuan Ding, Xingyue Ma, Jian Wang, Ningchong Zheng, Yuefeng Nie, Yu Deng, Laurent Bellaiche, Yurong Yang, Di Wu

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DOI: 10.1063/5.0144958
Published: 2023-09-01
Container: Applied Physics Reviews
Publisher: AIP Publishing
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1063/5.0144958,
  title = {Flexoelectricity-stabilized ferroelectric phase with enhanced reliability in ultrathin La:HfO2 films},
  author = {Peijie Jiao and Hao Cheng and Jiayi Li and Hongying Chen and Zhiyu Liu and Zhongnan Xi and Wenjuan Ding and Xingyue Ma and Jian Wang and Ningchong Zheng and Yuefeng Nie and Yu Deng and Laurent Bellaiche and Yurong Yang and Di Wu},
  year = {2023},
  journal = {Applied Physics Reviews},
  doi = {10.1063/5.0144958},
  url = {https://doi.org/10.1063/5.0144958}
}

RIS

TY  - JOUR
TI  - Flexoelectricity-stabilized ferroelectric phase with enhanced reliability in ultrathin La:HfO2 films
AU  - Peijie Jiao
AU  - Hao Cheng
AU  - Jiayi Li
AU  - Hongying Chen
AU  - Zhiyu Liu
AU  - Zhongnan Xi
AU  - Wenjuan Ding
AU  - Xingyue Ma
AU  - Jian Wang
AU  - Ningchong Zheng
AU  - Yuefeng Nie
AU  - Yu Deng
AU  - Laurent Bellaiche
AU  - Yurong Yang
AU  - Di Wu
PY  - 2023
JO  - Applied Physics Reviews
DO  - 10.1063/5.0144958
UR  - https://doi.org/10.1063/5.0144958
ER  -

APA

Jiao, P., Cheng, H., Li, J., Chen, H., Liu, Z., Xi, Z., Ding, W., Ma, X., Wang, J., Zheng, N., Nie, Y., Deng, Y., Bellaiche, L., Yang, Y., & Wu, D. (2023). Flexoelectricity-stabilized ferroelectric phase with enhanced reliability in ultrathin La:HfO2 films. Applied Physics Reviews. https://doi.org/10.1063/5.0144958

Source records

crossref · retrieved 2026-09-25T12:08:25.120Z