Advancement of Langmuir probe-based laser photo-detachment technique for negative ion density measurement in a high-power helicon plasma source

D. Mukhopadhyay, M. Bandyopadhyay, H. Tyagi, K. Patel

Open source

DOI
10.1063/5.0186429
Published
2024-04-01
Container
Review of Scientific Instruments
Publisher
AIP Publishing
Open access
unknown

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BibTeX

@article{allodium:10.1063/5.0186429,
  title = {Advancement of Langmuir probe-based laser photo-detachment technique for negative ion density measurement in a high-power helicon plasma source},
  author = {D. Mukhopadhyay and M. Bandyopadhyay and H. Tyagi and K. Patel},
  year = {2024},
  journal = {Review of Scientific Instruments},
  doi = {10.1063/5.0186429},
  url = {https://doi.org/10.1063/5.0186429}
}

RIS

TY  - JOUR
TI  - Advancement of Langmuir probe-based laser photo-detachment technique for negative ion density measurement in a high-power helicon plasma source
AU  - D. Mukhopadhyay
AU  - M. Bandyopadhyay
AU  - H. Tyagi
AU  - K. Patel
PY  - 2024
JO  - Review of Scientific Instruments
DO  - 10.1063/5.0186429
UR  - https://doi.org/10.1063/5.0186429
ER  - 

APA

Mukhopadhyay, D., Bandyopadhyay, M., Tyagi, H., & Patel, K. (2024). Advancement of Langmuir probe-based laser photo-detachment technique for negative ion density measurement in a high-power helicon plasma source. Review of Scientific Instruments. https://doi.org/10.1063/5.0186429

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