AC metrology applications of the Josephson effect

S. P. Benz, J. Biesecker, C. J. Burroughs, M. A. Castellanos-Beltran, P. D. Dresselhaus, N. E. Flowers-Jacobs, A. E. Fox, P. F. Hopkins, R. Johnson-Wilke, D. Olaya, A. Rüfenacht, A. J. Sirois, J. N. Thomas

Open source

DOI
10.1063/5.0219991
Published
2024-07-29
Container
Applied Physics Letters
Publisher
AIP Publishing
Open access
unknown

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BibTeX

@article{allodium:10.1063/5.0219991,
  title = {AC metrology applications of the Josephson effect},
  author = {S. P. Benz and J. Biesecker and C. J. Burroughs and M. A. Castellanos-Beltran and P. D. Dresselhaus and N. E. Flowers-Jacobs and A. E. Fox and P. F. Hopkins and R. Johnson-Wilke and D. Olaya and A. Rüfenacht and A. J. Sirois and J. N. Thomas},
  year = {2024},
  journal = {Applied Physics Letters},
  doi = {10.1063/5.0219991},
  url = {https://doi.org/10.1063/5.0219991}
}

RIS

TY  - JOUR
TI  - AC metrology applications of the Josephson effect
AU  - S. P. Benz
AU  - J. Biesecker
AU  - C. J. Burroughs
AU  - M. A. Castellanos-Beltran
AU  - P. D. Dresselhaus
AU  - N. E. Flowers-Jacobs
AU  - A. E. Fox
AU  - P. F. Hopkins
AU  - R. Johnson-Wilke
AU  - D. Olaya
AU  - A. Rüfenacht
AU  - A. J. Sirois
AU  - J. N. Thomas
PY  - 2024
JO  - Applied Physics Letters
DO  - 10.1063/5.0219991
UR  - https://doi.org/10.1063/5.0219991
ER  - 

APA

Benz, S. P., Biesecker, J., Burroughs, C. J., Castellanos-Beltran, M. A., Dresselhaus, P. D., Flowers-Jacobs, N. E., Fox, A. E., Hopkins, P. F., Johnson-Wilke, R., Olaya, D., Rüfenacht, A., Sirois, A. J., & Thomas, J. N. (2024). AC metrology applications of the Josephson effect. Applied Physics Letters. https://doi.org/10.1063/5.0219991

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