Nondestructive analysis of threading mixed dislocations in SiC using x-ray topography and birefringence
- DOI
- 10.1063/5.0238854
- Published
- 2
- Container
- AIP Advances
- Publisher
- Not recorded
- Open access
- yes
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Cite this work
BibTeX
@article{allodium:10.1063/5.0238854,
title = {Nondestructive analysis of threading mixed dislocations in SiC using x-ray topography and birefringence},
author = {Shunta Harada and Yasutaka Matsubara and Shohei Hayashi and Michio Kawase and Keisuke Seo and Seiya Mizutani and Yuya Mizutani and Seiji Mizutani and Kenta Murayama},
year = {2025},
journal = {AIP Advances},
doi = {10.1063/5.0238854},
url = {https://doi.org/10.1063/5.0238854}
}RIS
TY - JOUR TI - Nondestructive analysis of threading mixed dislocations in SiC using x-ray topography and birefringence AU - Shunta Harada AU - Yasutaka Matsubara AU - Shohei Hayashi AU - Michio Kawase AU - Keisuke Seo AU - Seiya Mizutani AU - Yuya Mizutani AU - Seiji Mizutani AU - Kenta Murayama PY - 2025 JO - AIP Advances DO - 10.1063/5.0238854 UR - https://doi.org/10.1063/5.0238854 ER -
APA
Harada, S., Matsubara, Y., Hayashi, S., Kawase, M., Seo, K., Mizutani, S., Mizutani, Y., Mizutani, S., & Murayama, K. (2025). Nondestructive analysis of threading mixed dislocations in SiC using x-ray topography and birefringence. AIP Advances. https://doi.org/10.1063/5.0238854
Source records
- doaj · retrieved 2026-09-27T08:43:54.469Z