Nondestructive analysis of threading mixed dislocations in SiC using x-ray topography and birefringence

Shunta Harada, Yasutaka Matsubara, Shohei Hayashi, Michio Kawase, Keisuke Seo, Seiya Mizutani, Yuya Mizutani, Seiji Mizutani, Kenta Murayama

Open source

DOI
10.1063/5.0238854
Published
2
Container
AIP Advances
Publisher
Not recorded
Open access
yes

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BibTeX

@article{allodium:10.1063/5.0238854,
  title = {Nondestructive analysis of threading mixed dislocations in SiC using x-ray topography and birefringence},
  author = {Shunta Harada and Yasutaka Matsubara and Shohei Hayashi and Michio Kawase and Keisuke Seo and Seiya Mizutani and Yuya Mizutani and Seiji Mizutani and Kenta Murayama},
  year = {2025},
  journal = {AIP Advances},
  doi = {10.1063/5.0238854},
  url = {https://doi.org/10.1063/5.0238854}
}

RIS

TY  - JOUR
TI  - Nondestructive analysis of threading mixed dislocations in SiC using x-ray topography and birefringence
AU  - Shunta Harada
AU  - Yasutaka Matsubara
AU  - Shohei Hayashi
AU  - Michio Kawase
AU  - Keisuke Seo
AU  - Seiya Mizutani
AU  - Yuya Mizutani
AU  - Seiji Mizutani
AU  - Kenta Murayama
PY  - 2025
JO  - AIP Advances
DO  - 10.1063/5.0238854
UR  - https://doi.org/10.1063/5.0238854
ER  - 

APA

Harada, S., Matsubara, Y., Hayashi, S., Kawase, M., Seo, K., Mizutani, S., Mizutani, Y., Mizutani, S., & Murayama, K. (2025). Nondestructive analysis of threading mixed dislocations in SiC using x-ray topography and birefringence. AIP Advances. https://doi.org/10.1063/5.0238854

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