Scanning microwave impedance microscopy and its applications: A review

Diego Tami, Douglas A. A. Ohlberg, Cássio Gonçalves do Rego, Gilberto Medeiros-Ribeiro, Jhonattan C. Ramirez

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DOI: 10.1063/5.0241574
Published: 2025-01-01
Container: APL Materials
Publisher: AIP Publishing
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1063/5.0241574,
  title = {Scanning microwave impedance microscopy and its applications: A review},
  author = {Diego Tami and Douglas A. A. Ohlberg and Cássio Gonçalves do Rego and Gilberto Medeiros-Ribeiro and Jhonattan C. Ramirez},
  year = {2025},
  journal = {APL Materials},
  doi = {10.1063/5.0241574},
  url = {https://doi.org/10.1063/5.0241574}
}

RIS

TY  - JOUR
TI  - Scanning microwave impedance microscopy and its applications: A review
AU  - Diego Tami
AU  - Douglas A. A. Ohlberg
AU  - Cássio Gonçalves do Rego
AU  - Gilberto Medeiros-Ribeiro
AU  - Jhonattan C. Ramirez
PY  - 2025
JO  - APL Materials
DO  - 10.1063/5.0241574
UR  - https://doi.org/10.1063/5.0241574
ER  -

APA

Tami, D., Ohlberg, D. A. A., Rego, C. G. D., Medeiros-Ribeiro, G., & Ramirez, J. C. (2025). Scanning microwave impedance microscopy and its applications: A review. APL Materials. https://doi.org/10.1063/5.0241574

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crossref · retrieved 2026-09-25T03:16:13.277Z