Environmental chambers for thin film characterization by grazing incidence x-ray scattering and broadband dielectric spectroscopy

Benjamin T. Ferko, Jack E. Granite, Viola A. Burlein, Stefan Mecking, Chinedum O. Osuji, Karen I. Winey

Open source

DOI
10.1063/5.0309613
Published
2026-04-01
Container
Review of Scientific Instruments
Publisher
AIP Publishing
Open access
unknown

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BibTeX

@article{allodium:10.1063/5.0309613,
  title = {Environmental chambers for thin film characterization by grazing incidence x-ray scattering and broadband dielectric spectroscopy},
  author = {Benjamin T. Ferko and Jack E. Granite and Viola A. Burlein and Stefan Mecking and Chinedum O. Osuji and Karen I. Winey},
  year = {2026},
  journal = {Review of Scientific Instruments},
  doi = {10.1063/5.0309613},
  url = {https://doi.org/10.1063/5.0309613}
}

RIS

TY  - JOUR
TI  - Environmental chambers for thin film characterization by grazing incidence x-ray scattering and broadband dielectric spectroscopy
AU  - Benjamin T. Ferko
AU  - Jack E. Granite
AU  - Viola A. Burlein
AU  - Stefan Mecking
AU  - Chinedum O. Osuji
AU  - Karen I. Winey
PY  - 2026
JO  - Review of Scientific Instruments
DO  - 10.1063/5.0309613
UR  - https://doi.org/10.1063/5.0309613
ER  - 

APA

Ferko, B. T., Granite, J. E., Burlein, V. A., Mecking, S., Osuji, C. O., & Winey, K. I. (2026). Environmental chambers for thin film characterization by grazing incidence x-ray scattering and broadband dielectric spectroscopy. Review of Scientific Instruments. https://doi.org/10.1063/5.0309613

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