Environmental chambers for thin film characterization by grazing incidence x-ray scattering and broadband dielectric spectroscopy
- DOI
- 10.1063/5.0309613
- Published
- 2026-04-01
- Container
- Review of Scientific Instruments
- Publisher
- AIP Publishing
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1063/5.0309613,
title = {Environmental chambers for thin film characterization by grazing incidence x-ray scattering and broadband dielectric spectroscopy},
author = {Benjamin T. Ferko and Jack E. Granite and Viola A. Burlein and Stefan Mecking and Chinedum O. Osuji and Karen I. Winey},
year = {2026},
journal = {Review of Scientific Instruments},
doi = {10.1063/5.0309613},
url = {https://doi.org/10.1063/5.0309613}
}RIS
TY - JOUR TI - Environmental chambers for thin film characterization by grazing incidence x-ray scattering and broadband dielectric spectroscopy AU - Benjamin T. Ferko AU - Jack E. Granite AU - Viola A. Burlein AU - Stefan Mecking AU - Chinedum O. Osuji AU - Karen I. Winey PY - 2026 JO - Review of Scientific Instruments DO - 10.1063/5.0309613 UR - https://doi.org/10.1063/5.0309613 ER -
APA
Ferko, B. T., Granite, J. E., Burlein, V. A., Mecking, S., Osuji, C. O., & Winey, K. I. (2026). Environmental chambers for thin film characterization by grazing incidence x-ray scattering and broadband dielectric spectroscopy. Review of Scientific Instruments. https://doi.org/10.1063/5.0309613
Source records
- crossref · retrieved 2026-09-26T17:27:14.930Z