Evaluation of spectroscopic ellipsometry from ultraviolet–visible–(near-infrared) to terahertz regions for the analysis of silicon photodiodes

Balaji Ramanujam, Mohammed Alaani, Dhurba R. Sapkota, Nikolas J. Podraza, Ambalanath Shan, Robert W. Collins

Open source

DOI: 10.1063/5.0321498
Published: 5
Container: AIP Advances
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.1063/5.0321498,
  title = {Evaluation of spectroscopic ellipsometry from ultraviolet–visible–(near-infrared) to terahertz regions for the analysis of silicon photodiodes},
  author = {Balaji Ramanujam and Mohammed Alaani and Dhurba R. Sapkota and Nikolas J. Podraza and Ambalanath Shan and Robert W. Collins},
  year = {2026},
  journal = {AIP Advances},
  doi = {10.1063/5.0321498},
  url = {https://doi.org/10.1063/5.0321498}
}

RIS

TY  - JOUR
TI  - Evaluation of spectroscopic ellipsometry from ultraviolet–visible–(near-infrared) to terahertz regions for the analysis of silicon photodiodes
AU  - Balaji Ramanujam
AU  - Mohammed Alaani
AU  - Dhurba R. Sapkota
AU  - Nikolas J. Podraza
AU  - Ambalanath Shan
AU  - Robert W. Collins
PY  - 2026
JO  - AIP Advances
DO  - 10.1063/5.0321498
UR  - https://doi.org/10.1063/5.0321498
ER  -

APA

Ramanujam, B., Alaani, M., Sapkota, D. R., Podraza, N. J., Shan, A., & Collins, R. W. (2026). Evaluation of spectroscopic ellipsometry from ultraviolet–visible–(near-infrared) to terahertz regions for the analysis of silicon photodiodes. AIP Advances. https://doi.org/10.1063/5.0321498

Source records

doaj · retrieved 2026-09-27T05:44:16.253Z