A cryogen-free terahertz near-field scanning noise microscope for nanoscale hot-electron imaging in devices at 70-300 K.
- DOI
- 10.1063/5.0332221
- Published
- 2026 Aug 1
- Container
- The Review of scientific instruments
- Publisher
- Not recorded
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1063/5.0332221,
title = {A cryogen-free terahertz near-field scanning noise microscope for nanoscale hot-electron imaging in devices at 70-300 K.},
author = {Wang Y and Deng W and Sun L and Wang S and Lu W and Weng Q},
year = {2026},
journal = {The Review of scientific instruments},
doi = {10.1063/5.0332221},
url = {https://doi.org/10.1063/5.0332221}
}RIS
TY - JOUR TI - A cryogen-free terahertz near-field scanning noise microscope for nanoscale hot-electron imaging in devices at 70-300 K. AU - Wang Y AU - Deng W AU - Sun L AU - Wang S AU - Lu W AU - Weng Q PY - 2026 JO - The Review of scientific instruments DO - 10.1063/5.0332221 UR - https://doi.org/10.1063/5.0332221 ER -
APA
Y, W., W, D., L, S., S, W., W, L., & Q, W. (2026). A cryogen-free terahertz near-field scanning noise microscope for nanoscale hot-electron imaging in devices at 70-300 K.. The Review of scientific instruments. https://doi.org/10.1063/5.0332221
Source records
- pubmed · retrieved 2026-11-10T06:55:29.234Z