A cryogen-free terahertz near-field scanning noise microscope for nanoscale hot-electron imaging in devices at 70–300 K
- DOI
- 10.1063/5.0332221
- Published
- 2026-08-01
- Container
- Review of Scientific Instruments
- Publisher
- AIP Publishing
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1063/5.0332221,
title = {A cryogen-free terahertz near-field scanning noise microscope for nanoscale hot-electron imaging in devices at 70–300 K},
author = {Yinan Wang and Weijie Deng and Likai Sun and Shaowei Wang and Wei Lu and Qianchun Weng},
year = {2026},
journal = {Review of Scientific Instruments},
doi = {10.1063/5.0332221},
url = {https://doi.org/10.1063/5.0332221}
}RIS
TY - JOUR TI - A cryogen-free terahertz near-field scanning noise microscope for nanoscale hot-electron imaging in devices at 70–300 K AU - Yinan Wang AU - Weijie Deng AU - Likai Sun AU - Shaowei Wang AU - Wei Lu AU - Qianchun Weng PY - 2026 JO - Review of Scientific Instruments DO - 10.1063/5.0332221 UR - https://doi.org/10.1063/5.0332221 ER -
APA
Wang, Y., Deng, W., Sun, L., Wang, S., Lu, W., & Weng, Q. (2026). A cryogen-free terahertz near-field scanning noise microscope for nanoscale hot-electron imaging in devices at 70–300 K. Review of Scientific Instruments. https://doi.org/10.1063/5.0332221
Source records
- crossref · retrieved 2026-09-25T06:05:29.388Z