Shot noise-mitigated secondary electron imaging with ion count-aided microscopy.

Agarwal A, Kasaei L, He X, Kitichotkul R, Hitit OK, Peng M, Schultz JA, Feldman LC, Goyal VK.

Open source

DOI
10.1073/pnas.2401246121
Published
2024-07-25
Container
Proc Natl Acad Sci U S A
Publisher
Not recorded
Open access
yes

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BibTeX

@article{allodium:10.1073/pnas.2401246121,
  title = {Shot noise-mitigated secondary electron imaging with ion count-aided microscopy.},
  author = {Agarwal A and  Kasaei L and  He X and  Kitichotkul R and  Hitit OK and  Peng M and  Schultz JA and  Feldman LC and  Goyal VK.},
  year = {2024},
  journal = {Proc Natl Acad Sci U S A},
  doi = {10.1073/pnas.2401246121},
  url = {https://doi.org/10.1073/pnas.2401246121}
}

RIS

TY  - JOUR
TI  - Shot noise-mitigated secondary electron imaging with ion count-aided microscopy.
AU  - Agarwal A
AU  -  Kasaei L
AU  -  He X
AU  -  Kitichotkul R
AU  -  Hitit OK
AU  -  Peng M
AU  -  Schultz JA
AU  -  Feldman LC
AU  -  Goyal VK.
PY  - 2024
JO  - Proc Natl Acad Sci U S A
DO  - 10.1073/pnas.2401246121
UR  - https://doi.org/10.1073/pnas.2401246121
ER  -

APA

A, A., L, K., X, H., R, K., OK, H., M, P., JA, S., LC, F., & VK., G. (2024). Shot noise-mitigated secondary electron imaging with ion count-aided microscopy.. Proc Natl Acad Sci U S A. https://doi.org/10.1073/pnas.2401246121

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