Device engineering for photocurrent detected magnetic resonance and scanning probes using solid-state spin defects
- DOI
- 10.1080/14686996.2026.2691682
- Published
- 2026-08-17
- Container
- Science and Technology of Advanced Materials
- Publisher
- Informa UK Limited
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1080/14686996.2026.2691682,
title = {Device engineering for photocurrent detected magnetic resonance and scanning probes using solid-state spin defects},
author = {Hiroki Morishita and Naoya Morioka and Eikichi Kimura and Keigo Arai and Yuichi Yamazaki and Toshu An and Shigemi Mizukami and Norikazu Mizuochi},
year = {2026},
journal = {Science and Technology of Advanced Materials},
doi = {10.1080/14686996.2026.2691682},
url = {https://doi.org/10.1080/14686996.2026.2691682}
}RIS
TY - JOUR TI - Device engineering for photocurrent detected magnetic resonance and scanning probes using solid-state spin defects AU - Hiroki Morishita AU - Naoya Morioka AU - Eikichi Kimura AU - Keigo Arai AU - Yuichi Yamazaki AU - Toshu An AU - Shigemi Mizukami AU - Norikazu Mizuochi PY - 2026 JO - Science and Technology of Advanced Materials DO - 10.1080/14686996.2026.2691682 UR - https://doi.org/10.1080/14686996.2026.2691682 ER -
APA
Morishita, H., Morioka, N., Kimura, E., Arai, K., Yamazaki, Y., An, T., Mizukami, S., & Mizuochi, N. (2026). Device engineering for photocurrent detected magnetic resonance and scanning probes using solid-state spin defects. Science and Technology of Advanced Materials. https://doi.org/10.1080/14686996.2026.2691682
Source records
- crossref · retrieved 2026-11-05T10:37:11.879Z