Crystallization of Magnetron Sputtered Amorphous Si1-xCx Films (x = 1/3) Studied by Grazing Incidence X-ray Diffractometry
- DOI
- 10.1080/14786435.2010.497474
- Published
- 2010-07-12
- Container
- Philosophical Magazine
- Publisher
- Not recorded
- Open access
- yes
Credibility signals
limited evidence Score 45/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.
Show all credibility signals
- cautionDOI registered: No matching Crossref record was present in this response.
- cautionDOI resolves: No matching Crossref record was present in this response.
- not scoredDirectory of Open Access Journals: No matching DOAJ record was present in this response. No allow-list match; this is not evidence of low credibility.
- not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made.
- not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made.
- not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made.
- not scoredROR affiliation: Not checked or no result supplied; no credibility inference made.
- not scoredRetraction Watch retraction: No retraction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- supportingOpen access status: Normalized open-access status: open.
- not scoredPublication license: Not checked or no result supplied; no credibility inference made.
- not scoredPublication version: A publication version was supplied but is not scored.
- cautionMetadata completeness: 5 of 6 scored descriptive metadata groups are present; missing fields increase uncertainty.
Cite this work
BibTeX
@article{allodium:10.1080/14786435.2010.497474,
title = {Crystallization of Magnetron Sputtered Amorphous Si1-xCx Films (x = 1/3) Studied by Grazing Incidence X-ray Diffractometry},
author = {Wolfgang Gruber and Hessam Hadjiamini Najafabadi and Udo Geckle and Michael Bruns and Harald Schmidt},
year = {2010},
journal = {Philosophical Magazine},
doi = {10.1080/14786435.2010.497474},
url = {https://doi.org/10.1080/14786435.2010.497474}
}RIS
TY - JOUR TI - Crystallization of Magnetron Sputtered Amorphous Si1-xCx Films (x = 1/3) Studied by Grazing Incidence X-ray Diffractometry AU - Wolfgang Gruber AU - Hessam Hadjiamini Najafabadi AU - Udo Geckle AU - Michael Bruns AU - Harald Schmidt PY - 2010 JO - Philosophical Magazine DO - 10.1080/14786435.2010.497474 UR - https://doi.org/10.1080/14786435.2010.497474 ER -
APA
Gruber, W., Najafabadi, H. H., Geckle, U., Bruns, M., & Schmidt, H. (2010). Crystallization of Magnetron Sputtered Amorphous Si1-xCx Films (x = 1/3) Studied by Grazing Incidence X-ray Diffractometry. Philosophical Magazine. https://doi.org/10.1080/14786435.2010.497474
Source records
- hal · retrieved 2026-09-25T18:22:13.991Z