Si-integrated ultrathin films of phase-pure Y<sub>3</sub>Fe<sub>5</sub>O<sub>12</sub> (YIG) via novel two-step rapid thermal anneal
- DOI
- 10.1080/21663831.2017.1295285
- Published
- 2017-03-01
- Container
- Materials Research Letters
- Publisher
- Informa UK Limited
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1080/21663831.2017.1295285,
title = {Si-integrated ultrathin films of phase-pure Y<sub>3</sub>Fe<sub>5</sub>O<sub>12</sub> (YIG) via novel two-step rapid thermal anneal},
author = {Thomas E. Gage and Prabesh Dulal and Peter A. Solheid and David J. Flannigan and Bethanie J. H. Stadler},
year = {2017},
journal = {Materials Research Letters},
doi = {10.1080/21663831.2017.1295285},
url = {https://doi.org/10.1080/21663831.2017.1295285}
}RIS
TY - JOUR TI - Si-integrated ultrathin films of phase-pure Y<sub>3</sub>Fe<sub>5</sub>O<sub>12</sub> (YIG) via novel two-step rapid thermal anneal AU - Thomas E. Gage AU - Prabesh Dulal AU - Peter A. Solheid AU - David J. Flannigan AU - Bethanie J. H. Stadler PY - 2017 JO - Materials Research Letters DO - 10.1080/21663831.2017.1295285 UR - https://doi.org/10.1080/21663831.2017.1295285 ER -
APA
Gage, T. E., Dulal, P., Solheid, P. A., Flannigan, D. J., & Stadler, B. J. H. (2017). Si-integrated ultrathin films of phase-pure Y<sub>3</sub>Fe<sub>5</sub>O<sub>12</sub> (YIG) via novel two-step rapid thermal anneal. Materials Research Letters. https://doi.org/10.1080/21663831.2017.1295285
Source records
- crossref · retrieved 2026-11-10T12:35:52.739Z