Noise-robust analysis of X-Ray absorption near-edge structure based on poisson distribution

Shuhei Kashiwamura, Shun Katakami, Taiga Yamasaki, Kazunori Iwamitsu, Hiroyuki Kumazoe, Kenji Nagata, Toshihiro Okajima, Ichiro Akai, Masato Okada

Open source

DOI: 10.1080/27660400.2024.2397939
Published: 12
Container: Science and Technology of Advanced Materials: Methods
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.1080/27660400.2024.2397939,
  title = {Noise-robust analysis of X-Ray absorption near-edge structure based on poisson distribution},
  author = {Shuhei Kashiwamura and Shun Katakami and Taiga Yamasaki and Kazunori Iwamitsu and Hiroyuki Kumazoe and Kenji Nagata and Toshihiro Okajima and Ichiro Akai and Masato Okada},
  year = {2024},
  journal = {Science and Technology of Advanced Materials: Methods},
  doi = {10.1080/27660400.2024.2397939},
  url = {https://doi.org/10.1080/27660400.2024.2397939}
}

RIS

TY  - JOUR
TI  - Noise-robust analysis of X-Ray absorption near-edge structure based on poisson distribution
AU  - Shuhei Kashiwamura
AU  - Shun Katakami
AU  - Taiga Yamasaki
AU  - Kazunori Iwamitsu
AU  - Hiroyuki Kumazoe
AU  - Kenji Nagata
AU  - Toshihiro Okajima
AU  - Ichiro Akai
AU  - Masato Okada
PY  - 2024
JO  - Science and Technology of Advanced Materials: Methods
DO  - 10.1080/27660400.2024.2397939
UR  - https://doi.org/10.1080/27660400.2024.2397939
ER  -

APA

Kashiwamura, S., Katakami, S., Yamasaki, T., Iwamitsu, K., Kumazoe, H., Nagata, K., Okajima, T., Akai, I., & Okada, M. (2024). Noise-robust analysis of X-Ray absorption near-edge structure based on poisson distribution. Science and Technology of Advanced Materials: Methods. https://doi.org/10.1080/27660400.2024.2397939

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doaj · retrieved 2026-09-26T14:57:12.654Z