Lateral resolution of electrostatic force microscopy for mapping of dielectric interfaces in ambient conditions.

Labardi M, Bertolla A, Sollogoub C, Casalini R, Capaccioli S

DOI: 10.1088/1361-6528/ab8ede
Published: 2020 Aug 14
Container: Nanotechnology
Publisher: Not recorded
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1088/1361-6528/ab8ede,
  title = {Lateral resolution of electrostatic force microscopy for mapping of dielectric interfaces in ambient conditions.},
  author = {Labardi M and Bertolla A and Sollogoub C and Casalini R and Capaccioli S},
  year = {2020},
  journal = {Nanotechnology},
  doi = {10.1088/1361-6528/ab8ede},
  url = {https://doi.org/10.1088/1361-6528/ab8ede}
}

RIS

TY  - JOUR
TI  - Lateral resolution of electrostatic force microscopy for mapping of dielectric interfaces in ambient conditions.
AU  - Labardi M
AU  - Bertolla A
AU  - Sollogoub C
AU  - Casalini R
AU  - Capaccioli S
PY  - 2020
JO  - Nanotechnology
DO  - 10.1088/1361-6528/ab8ede
UR  - https://doi.org/10.1088/1361-6528/ab8ede
ER  -

APA

M, L., A, B., C, S., R, C., & S, C. (2020). Lateral resolution of electrostatic force microscopy for mapping of dielectric interfaces in ambient conditions.. Nanotechnology. https://doi.org/10.1088/1361-6528/ab8ede

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pubmed · retrieved 2026-09-26T23:53:25.332Z