A strategy to fabricate nanostructures with sub-nanometer line edge roughness.

Zhuang X, Deng Y, Zhang Y, Wang K, Chen Y, Gao S, Xu J, Wang L, Cheng X

DOI: 10.1088/1361-6528/ad6e88
Published: 2024 Sep 25
Container: Nanotechnology
Publisher: Not recorded
Open access: unknown

Credibility signals

limited evidence Score 43/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

cautionDOI registered: No matching Crossref record was present in this response. Source: Crossref; license: CC0 metadata
cautionDOI resolves: No matching Crossref record was present in this response. Source: Crossref; license: CC0 metadata
not scoredDirectory of Open Access Journals: No matching DOAJ record was present in this response. No allow-list match; this is not evidence of low credibility. Source: DOAJ; license: CC0
not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredROR affiliation: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredRetraction Watch retraction: No retraction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredOpen access status: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication license: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication version: A publication version was supplied but is not scored. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer
cautionMetadata completeness: 5 of 6 scored descriptive metadata groups are present; missing fields increase uncertainty. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer

Cite this work

BibTeX

@article{allodium:10.1088/1361-6528/ad6e88,
  title = {A strategy to fabricate nanostructures with sub-nanometer line edge roughness.},
  author = {Zhuang X and Deng Y and Zhang Y and Wang K and Chen Y and Gao S and Xu J and Wang L and Cheng X},
  year = {2024},
  journal = {Nanotechnology},
  doi = {10.1088/1361-6528/ad6e88},
  url = {https://doi.org/10.1088/1361-6528/ad6e88}
}

RIS

TY  - JOUR
TI  - A strategy to fabricate nanostructures with sub-nanometer line edge roughness.
AU  - Zhuang X
AU  - Deng Y
AU  - Zhang Y
AU  - Wang K
AU  - Chen Y
AU  - Gao S
AU  - Xu J
AU  - Wang L
AU  - Cheng X
PY  - 2024
JO  - Nanotechnology
DO  - 10.1088/1361-6528/ad6e88
UR  - https://doi.org/10.1088/1361-6528/ad6e88
ER  -

APA

X, Z., Y, D., Y, Z., K, W., Y, C., S, G., J, X., L, W., & X, C. (2024). A strategy to fabricate nanostructures with sub-nanometer line edge roughness.. Nanotechnology. https://doi.org/10.1088/1361-6528/ad6e88

Source records

pubmed · retrieved 2026-09-26T00:54:37.068Z