Secondary electron emission current mapping for nanoscale thermometry

William A Hubbard, Matthew Mecklenburg, Ho Leung Chan, B C Regan

Open source

DOI: 10.1088/1361-6528/ade445
Published: 2025-06-24
Container: Nanotechnology
Publisher: IOP Publishing
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1088/1361-6528/ade445,
  title = {Secondary electron emission current mapping for nanoscale thermometry},
  author = {William A Hubbard and Matthew Mecklenburg and Ho Leung Chan and B C Regan},
  year = {2025},
  journal = {Nanotechnology},
  doi = {10.1088/1361-6528/ade445},
  url = {https://doi.org/10.1088/1361-6528/ade445}
}

RIS

TY  - JOUR
TI  - Secondary electron emission current mapping for nanoscale thermometry
AU  - William A Hubbard
AU  - Matthew Mecklenburg
AU  - Ho Leung Chan
AU  - B C Regan
PY  - 2025
JO  - Nanotechnology
DO  - 10.1088/1361-6528/ade445
UR  - https://doi.org/10.1088/1361-6528/ade445
ER  -

APA

Hubbard, W. A., Mecklenburg, M., Chan, H. L., & Regan, B. C. (2025). Secondary electron emission current mapping for nanoscale thermometry. Nanotechnology. https://doi.org/10.1088/1361-6528/ade445

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crossref · retrieved 2026-09-25T07:41:22.508Z