Efficient total ionizing dose-aware standard cell characterization methodology for path-level timing performance in nanoscale digital circuit applications

Lomash Chandra Acharya, Khoirom Johnson Singh, Neha Gupta, Mahipal Dargupally, Neeraj Mishra, Arvind Kumar Sharma, Abhishek Acharya, Venkatraman Ramakrishnan, Ajoy Mandal, Sudeb Dasgupta, Anand Bulusu

Open source

DOI
10.1088/1361-6528/ae2a3c
Published
2026-01-28
Container
Nanotechnology
Publisher
IOP Publishing
Open access
unknown

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BibTeX

@article{allodium:10.1088/1361-6528/ae2a3c,
  title = {Efficient total ionizing dose-aware standard cell characterization methodology for path-level timing performance in nanoscale digital circuit applications},
  author = {Lomash Chandra Acharya and Khoirom Johnson Singh and Neha Gupta and Mahipal Dargupally and Neeraj Mishra and Arvind Kumar Sharma and Abhishek Acharya and Venkatraman Ramakrishnan and Ajoy Mandal and Sudeb Dasgupta and Anand Bulusu},
  year = {2026},
  journal = {Nanotechnology},
  doi = {10.1088/1361-6528/ae2a3c},
  url = {https://doi.org/10.1088/1361-6528/ae2a3c}
}

RIS

TY  - JOUR
TI  - Efficient total ionizing dose-aware standard cell characterization methodology for path-level timing performance in nanoscale digital circuit applications
AU  - Lomash Chandra Acharya
AU  - Khoirom Johnson Singh
AU  - Neha Gupta
AU  - Mahipal Dargupally
AU  - Neeraj Mishra
AU  - Arvind Kumar Sharma
AU  - Abhishek Acharya
AU  - Venkatraman Ramakrishnan
AU  - Ajoy Mandal
AU  - Sudeb Dasgupta
AU  - Anand Bulusu
PY  - 2026
JO  - Nanotechnology
DO  - 10.1088/1361-6528/ae2a3c
UR  - https://doi.org/10.1088/1361-6528/ae2a3c
ER  - 

APA

Acharya, L. C., Singh, K. J., Gupta, N., Dargupally, M., Mishra, N., Sharma, A. K., Acharya, A., Ramakrishnan, V., Mandal, A., Dasgupta, S., & Bulusu, A. (2026). Efficient total ionizing dose-aware standard cell characterization methodology for path-level timing performance in nanoscale digital circuit applications. Nanotechnology. https://doi.org/10.1088/1361-6528/ae2a3c

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