Single atom chemical identification of TMD defects in ambient conditions

E J Dunn, A J Robson, R J Young, S P Jarvis

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DOI: 10.1088/1361-6528/ae5194
Published: 2026-04-02
Container: Nanotechnology
Publisher: IOP Publishing
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1088/1361-6528/ae5194,
  title = {Single atom chemical identification of TMD defects in ambient conditions},
  author = {E J Dunn and A J Robson and R J Young and S P Jarvis},
  year = {2026},
  journal = {Nanotechnology},
  doi = {10.1088/1361-6528/ae5194},
  url = {https://doi.org/10.1088/1361-6528/ae5194}
}

RIS

TY  - JOUR
TI  - Single atom chemical identification of TMD defects in ambient conditions
AU  - E J Dunn
AU  - A J Robson
AU  - R J Young
AU  - S P Jarvis
PY  - 2026
JO  - Nanotechnology
DO  - 10.1088/1361-6528/ae5194
UR  - https://doi.org/10.1088/1361-6528/ae5194
ER  -

APA

Dunn, E. J., Robson, A. J., Young, R. J., & Jarvis, S. P. (2026). Single atom chemical identification of TMD defects in ambient conditions. Nanotechnology. https://doi.org/10.1088/1361-6528/ae5194

Source records

crossref · retrieved 2026-09-25T11:36:54.985Z