Understanding the volatile memristor via direct observation of surface diffusion-regulated Cu-based conductive filaments

Bo Zhang, Guangyu Wen, Xu Zhao, Xinmou Ning, Gongjie Liu, Janicek Petr, Tomas Wagner

Open source

DOI: 10.1088/1361-6528/ae645a
Published: 2026-05-07
Container: Nanotechnology
Publisher: IOP Publishing
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1088/1361-6528/ae645a,
  title = {Understanding the volatile memristor via direct observation of surface diffusion-regulated Cu-based conductive filaments},
  author = {Bo Zhang and Guangyu Wen and Xu Zhao and Xinmou Ning and Gongjie Liu and Janicek Petr and Tomas Wagner},
  year = {2026},
  journal = {Nanotechnology},
  doi = {10.1088/1361-6528/ae645a},
  url = {https://doi.org/10.1088/1361-6528/ae645a}
}

RIS

TY  - JOUR
TI  - Understanding the volatile memristor via direct observation of surface diffusion-regulated Cu-based conductive filaments
AU  - Bo Zhang
AU  - Guangyu Wen
AU  - Xu Zhao
AU  - Xinmou Ning
AU  - Gongjie Liu
AU  - Janicek Petr
AU  - Tomas Wagner
PY  - 2026
JO  - Nanotechnology
DO  - 10.1088/1361-6528/ae645a
UR  - https://doi.org/10.1088/1361-6528/ae645a
ER  -

APA

Zhang, B., Wen, G., Zhao, X., Ning, X., Liu, G., Petr, J., & Wagner, T. (2026). Understanding the volatile memristor via direct observation of surface diffusion-regulated Cu-based conductive filaments. Nanotechnology. https://doi.org/10.1088/1361-6528/ae645a

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crossref · retrieved 2026-09-25T08:20:09.830Z