Electro-thermal modeling of excess voltage induced by surface degradation in Bi <sub>2</sub> Sr <sub>2</sub> CaCu <sub>2</sub> O <sub>8+δ</sub> intrinsic Josephson junction terahertz sources
- DOI
- 10.1088/1361-6528/aea7a6
- Published
- 2026-09-25
- Container
- Nanotechnology
- Publisher
- IOP Publishing
- Open access
- unknown
Credibility signals
uncertain Score 64/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.
Show all credibility signals
- supportingDOI registered: A matching record was returned by Crossref.
- supportingDOI resolves: A matching record was returned by Crossref.
- not scoredDirectory of Open Access Journals: No matching DOAJ record was present in this response. No allow-list match; this is not evidence of low credibility.
- not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made.
- not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made.
- not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made.
- not scoredROR affiliation: Not checked or no result supplied; no credibility inference made.
- not scoredRetraction Watch retraction: No retraction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete.
- not scoredOpen access status: Not checked or no result supplied; no credibility inference made.
- not scoredPublication license: Not checked or no result supplied; no credibility inference made.
- not scoredPublication version: A publication version was supplied but is not scored.
- supportingMetadata completeness: All 6 scored descriptive metadata groups are present.
Cite this work
BibTeX
@article{allodium:10.1088/1361-6528/aea7a6,
title = {Electro-thermal modeling of excess voltage induced by surface degradation in Bi
<sub>2</sub>
Sr
<sub>2</sub>
CaCu
<sub>2</sub>
O
<sub>8+δ</sub>
intrinsic Josephson junction terahertz sources},
author = {Huili Zhang and Wanghao Tian},
year = {2026},
journal = {Nanotechnology},
doi = {10.1088/1361-6528/aea7a6},
url = {https://doi.org/10.1088/1361-6528/aea7a6}
}RIS
TY - JOUR
TI - Electro-thermal modeling of excess voltage induced by surface degradation in Bi
<sub>2</sub>
Sr
<sub>2</sub>
CaCu
<sub>2</sub>
O
<sub>8+δ</sub>
intrinsic Josephson junction terahertz sources
AU - Huili Zhang
AU - Wanghao Tian
PY - 2026
JO - Nanotechnology
DO - 10.1088/1361-6528/aea7a6
UR - https://doi.org/10.1088/1361-6528/aea7a6
ER - APA
Zhang, H., & Tian, W. (2026). Electro-thermal modeling of excess voltage induced by surface degradation in Bi <sub>2</sub> Sr <sub>2</sub> CaCu <sub>2</sub> O <sub>8+δ</sub> intrinsic Josephson junction terahertz sources. Nanotechnology. https://doi.org/10.1088/1361-6528/aea7a6
Source records
- crossref · retrieved 2026-09-25T10:52:23.442Z