Evaluation of radiation hardness of High-Voltage silicon vertical JFETs

G. Giacomini, M. Bomben, W. Chen, D. Lynn

Open source

DOI: 10.1088/1748-0221/15/11/t11001
Published: 2020-11-02
Container: Journal of Instrumentation
Publisher: IOP Publishing
Open access: unknown

Credibility signals

uncertain Score 64/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

supportingDOI registered: A matching record was returned by Crossref. Source: Crossref; license: CC0 metadata
supportingDOI resolves: A matching record was returned by Crossref. Source: Crossref; license: CC0 metadata
not scoredDirectory of Open Access Journals: No matching DOAJ record was present in this response. No allow-list match; this is not evidence of low credibility. Source: DOAJ; license: CC0
not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredROR affiliation: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredRetraction Watch retraction: No retraction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredOpen access status: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication license: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication version: A publication version was supplied but is not scored. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer
supportingMetadata completeness: All 6 scored descriptive metadata groups are present. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer

Cite this work

BibTeX

@article{allodium:10.1088/1748-0221/15/11/t11001,
  title = {Evaluation of radiation hardness of High-Voltage silicon vertical JFETs},
  author = {G. Giacomini and M. Bomben and W. Chen and D. Lynn},
  year = {2020},
  journal = {Journal of Instrumentation},
  doi = {10.1088/1748-0221/15/11/t11001},
  url = {https://doi.org/10.1088/1748-0221/15/11/t11001}
}

RIS

TY  - JOUR
TI  - Evaluation of radiation hardness of High-Voltage silicon vertical JFETs
AU  - G. Giacomini
AU  - M. Bomben
AU  - W. Chen
AU  - D. Lynn
PY  - 2020
JO  - Journal of Instrumentation
DO  - 10.1088/1748-0221/15/11/t11001
UR  - https://doi.org/10.1088/1748-0221/15/11/t11001
ER  -

APA

Giacomini, G., Bomben, M., Chen, W., & Lynn, D. (2020). Evaluation of radiation hardness of High-Voltage silicon vertical JFETs. Journal of Instrumentation. https://doi.org/10.1088/1748-0221/15/11/t11001

Source records

crossref · retrieved 2026-09-26T18:07:26.027Z