RETRACTED: Carbon impact on surface morphology and electrical properties of Cu-TiC thin film

Avishek Roy, Shilabati Hembram, Manojit Ghosh, Abhijit Majumdar

DOI: 10.1088/2053-1591/ab7e49
Published: 2020-03-01
Container: Materials Research Express
Publisher: IOP Publishing
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1088/2053-1591/ab7e49,
  title = {RETRACTED: Carbon impact on surface morphology and electrical properties of Cu-TiC thin film},
  author = {Avishek Roy and Shilabati Hembram and Manojit Ghosh and Abhijit Majumdar},
  year = {2020},
  journal = {Materials Research Express},
  doi = {10.1088/2053-1591/ab7e49},
  url = {https://doi.org/10.1088/2053-1591/ab7e49}
}

RIS

TY  - JOUR
TI  - RETRACTED: Carbon impact on surface morphology and electrical properties of Cu-TiC thin film
AU  - Avishek Roy
AU  - Shilabati Hembram
AU  - Manojit Ghosh
AU  - Abhijit Majumdar
PY  - 2020
JO  - Materials Research Express
DO  - 10.1088/2053-1591/ab7e49
UR  - https://doi.org/10.1088/2053-1591/ab7e49
ER  -

APA

Roy, A., Hembram, S., Ghosh, M., & Majumdar, A. (2020). RETRACTED: Carbon impact on surface morphology and electrical properties of Cu-TiC thin film. Materials Research Express. https://doi.org/10.1088/2053-1591/ab7e49

Source records

crossref · retrieved 2026-09-25T14:49:23.665Z