RETRACTED: Electrical and structural properties of pure and self-defected Bi <sub>1</sub> /2Na <sub>1/2</sub> TiO <sub>3</sub> system: A DFT study
- DOI
- 10.1088/2053-1591/ac41e1
- Published
- 2021-12-10
- Container
- Materials Research Express
- Publisher
- IOP Publishing
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1088/2053-1591/ac41e1,
title = {RETRACTED: Electrical and structural properties of pure and self-defected Bi
<sub>1</sub>
/2Na
<sub>1/2</sub>
TiO
<sub>3</sub>
system: A DFT study},
author = {Vu Tien Lam},
year = {2021},
journal = {Materials Research Express},
doi = {10.1088/2053-1591/ac41e1},
url = {https://doi.org/10.1088/2053-1591/ac41e1}
}RIS
TY - JOUR
TI - RETRACTED: Electrical and structural properties of pure and self-defected Bi
<sub>1</sub>
/2Na
<sub>1/2</sub>
TiO
<sub>3</sub>
system: A DFT study
AU - Vu Tien Lam
PY - 2021
JO - Materials Research Express
DO - 10.1088/2053-1591/ac41e1
UR - https://doi.org/10.1088/2053-1591/ac41e1
ER - APA
Lam, V. T. (2021). RETRACTED: Electrical and structural properties of pure and self-defected Bi <sub>1</sub> /2Na <sub>1/2</sub> TiO <sub>3</sub> system: A DFT study. Materials Research Express. https://doi.org/10.1088/2053-1591/ac41e1
Source records
- crossref · retrieved 2026-11-10T14:50:16.633Z