Evaluation of depth of dislocation visibility in SEM electron channeling contrast imaging in Ti-6Al-4V alloy using serial sectioning method.

Yamasaki S, Deguchi M, Mitsuhara M, Nakashima H, Ota Y, Kubushiro K

Open source

DOI
10.1093/jmicro/dfaa060
Published
2021 Jun 6
Container
Microscopy (Oxford, England)
Publisher
Not recorded
Open access
unknown

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BibTeX

@article{allodium:10.1093/jmicro/dfaa060,
  title = {Evaluation of depth of dislocation visibility in SEM electron channeling contrast imaging in Ti-6Al-4V alloy using serial sectioning method.},
  author = {Yamasaki S and Deguchi M and Mitsuhara M and Nakashima H and Ota Y and Kubushiro K},
  year = {2021},
  journal = {Microscopy (Oxford, England)},
  doi = {10.1093/jmicro/dfaa060},
  url = {https://doi.org/10.1093/jmicro/dfaa060}
}

RIS

TY  - JOUR
TI  - Evaluation of depth of dislocation visibility in SEM electron channeling contrast imaging in Ti-6Al-4V alloy using serial sectioning method.
AU  - Yamasaki S
AU  - Deguchi M
AU  - Mitsuhara M
AU  - Nakashima H
AU  - Ota Y
AU  - Kubushiro K
PY  - 2021
JO  - Microscopy (Oxford, England)
DO  - 10.1093/jmicro/dfaa060
UR  - https://doi.org/10.1093/jmicro/dfaa060
ER  - 

APA

S, Y., M, D., M, M., H, N., Y, O., & K, K. (2021). Evaluation of depth of dislocation visibility in SEM electron channeling contrast imaging in Ti-6Al-4V alloy using serial sectioning method.. Microscopy (Oxford, England). https://doi.org/10.1093/jmicro/dfaa060

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