Near-field electron ptychography using full-field structured illumination.

Tamaki H, Saitoh K

Open source

DOI
10.1093/jmicro/dfae035
Published
2025 Jan 30
Container
Microscopy (Oxford, England)
Publisher
Not recorded
Open access
yes

Credibility signals

limited evidence Score 45/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

Cite this work

BibTeX

@article{allodium:10.1093/jmicro/dfae035,
  title = {Near-field electron ptychography using full-field structured illumination.},
  author = {Tamaki H and Saitoh K},
  year = {2025},
  journal = {Microscopy (Oxford, England)},
  doi = {10.1093/jmicro/dfae035},
  url = {https://doi.org/10.1093/jmicro/dfae035}
}

RIS

TY  - JOUR
TI  - Near-field electron ptychography using full-field structured illumination.
AU  - Tamaki H
AU  - Saitoh K
PY  - 2025
JO  - Microscopy (Oxford, England)
DO  - 10.1093/jmicro/dfae035
UR  - https://doi.org/10.1093/jmicro/dfae035
ER  - 

APA

H, T., & K, S. (2025). Near-field electron ptychography using full-field structured illumination.. Microscopy (Oxford, England). https://doi.org/10.1093/jmicro/dfae035

Source records