Image simulation in projection-type electron microscopy for understanding experimental images under non-optimal conditions.

Morimoto T, Enyama M, Ikegami A

DOI: 10.1093/jmicro/dfag013
Published: 2026 Jun 1
Container: Microscopy (Oxford, England)
Publisher: Not recorded
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1093/jmicro/dfag013,
  title = {Image simulation in projection-type electron microscopy for understanding experimental images under non-optimal conditions.},
  author = {Morimoto T and Enyama M and Ikegami A},
  year = {2026},
  journal = {Microscopy (Oxford, England)},
  doi = {10.1093/jmicro/dfag013},
  url = {https://doi.org/10.1093/jmicro/dfag013}
}

RIS

TY  - JOUR
TI  - Image simulation in projection-type electron microscopy for understanding experimental images under non-optimal conditions.
AU  - Morimoto T
AU  - Enyama M
AU  - Ikegami A
PY  - 2026
JO  - Microscopy (Oxford, England)
DO  - 10.1093/jmicro/dfag013
UR  - https://doi.org/10.1093/jmicro/dfag013
ER  -

APA

T, M., M, E., & A, I. (2026). Image simulation in projection-type electron microscopy for understanding experimental images under non-optimal conditions.. Microscopy (Oxford, England). https://doi.org/10.1093/jmicro/dfag013

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pubmed · retrieved 2026-09-26T21:36:30.608Z