Applications of Secondary and Backscattered Electron Spectroscopic Imaging and a Proposal for New SEM Image Nomenclature.

Sekiguchi T, Yao Y

DOI: 10.1093/jmicro/dfag037
Published: 2026 Oct 21
Container: Microscopy (Oxford, England)
Publisher: Not recorded
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1093/jmicro/dfag037,
  title = {Applications of Secondary and Backscattered Electron Spectroscopic Imaging and a Proposal for New SEM Image Nomenclature.},
  author = {Sekiguchi T and Yao Y},
  year = {2026},
  journal = {Microscopy (Oxford, England)},
  doi = {10.1093/jmicro/dfag037},
  url = {https://doi.org/10.1093/jmicro/dfag037}
}

RIS

TY  - JOUR
TI  - Applications of Secondary and Backscattered Electron Spectroscopic Imaging and a Proposal for New SEM Image Nomenclature.
AU  - Sekiguchi T
AU  - Yao Y
PY  - 2026
JO  - Microscopy (Oxford, England)
DO  - 10.1093/jmicro/dfag037
UR  - https://doi.org/10.1093/jmicro/dfag037
ER  -

APA

T, S., & Y, Y. (2026). Applications of Secondary and Backscattered Electron Spectroscopic Imaging and a Proposal for New SEM Image Nomenclature.. Microscopy (Oxford, England). https://doi.org/10.1093/jmicro/dfag037

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pubmed · retrieved 2026-11-10T07:18:29.899Z