Backscattered electron imaging and elemental analysis of rapidly frozen plant cells using variable accelerating voltage.

Kaneko Y, Tokunaga M, Tanaka K, Atsuzawa K, Nishimura M

DOI: 10.1093/jmicro/dfx133
Published: 2018 Apr 1
Container: Microscopy (Oxford, England)
Publisher: Not recorded
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1093/jmicro/dfx133,
  title = {Backscattered electron imaging and elemental analysis of rapidly frozen plant cells using variable accelerating voltage.},
  author = {Kaneko Y and Tokunaga M and Tanaka K and Atsuzawa K and Nishimura M},
  year = {2018},
  journal = {Microscopy (Oxford, England)},
  doi = {10.1093/jmicro/dfx133},
  url = {https://doi.org/10.1093/jmicro/dfx133}
}

RIS

TY  - JOUR
TI  - Backscattered electron imaging and elemental analysis of rapidly frozen plant cells using variable accelerating voltage.
AU  - Kaneko Y
AU  - Tokunaga M
AU  - Tanaka K
AU  - Atsuzawa K
AU  - Nishimura M
PY  - 2018
JO  - Microscopy (Oxford, England)
DO  - 10.1093/jmicro/dfx133
UR  - https://doi.org/10.1093/jmicro/dfx133
ER  -

APA

Y, K., M, T., K, T., K, A., & M, N. (2018). Backscattered electron imaging and elemental analysis of rapidly frozen plant cells using variable accelerating voltage.. Microscopy (Oxford, England). https://doi.org/10.1093/jmicro/dfx133

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pubmed · retrieved 2026-09-26T09:58:58.479Z