Novel Hybrid Semiconductor-Cellular Standard for 3D FIB-SEM Nanotomography Analysis.
- DOI
- 10.1093/mam/ozag036
- Published
- 2026 Jul 1
- Container
- Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
- Publisher
- Not recorded
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1093/mam/ozag036,
title = {Novel Hybrid Semiconductor-Cellular Standard for 3D FIB-SEM Nanotomography Analysis.},
author = {Williams A and Laquerre A and Grandfield K and Bassim N and Phaneuf MW},
year = {2026},
journal = {Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada},
doi = {10.1093/mam/ozag036},
url = {https://doi.org/10.1093/mam/ozag036}
}RIS
TY - JOUR TI - Novel Hybrid Semiconductor-Cellular Standard for 3D FIB-SEM Nanotomography Analysis. AU - Williams A AU - Laquerre A AU - Grandfield K AU - Bassim N AU - Phaneuf MW PY - 2026 JO - Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada DO - 10.1093/mam/ozag036 UR - https://doi.org/10.1093/mam/ozag036 ER -
APA
A, W., A, L., K, G., N, B., & MW, P. (2026). Novel Hybrid Semiconductor-Cellular Standard for 3D FIB-SEM Nanotomography Analysis.. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. https://doi.org/10.1093/mam/ozag036
Source records
- pubmed · retrieved 2026-09-26T04:40:24.213Z