Room-Temperature FIB-Based TEM Specimen Preparation for Radiation-Sensitive Solid-State Electrolytes.

Hao R, Shi H, Gao T, Hu X, Zhao H, Yuan Q, Liu W, Yu Y

Open source

DOI
10.1093/mam/ozag086
Published
2026 Sep 8
Container
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Publisher
Not recorded
Open access
unknown

Credibility signals

limited evidence Score 43/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

Cite this work

BibTeX

@article{allodium:10.1093/mam/ozag086,
  title = {Room-Temperature FIB-Based TEM Specimen Preparation for Radiation-Sensitive Solid-State Electrolytes.},
  author = {Hao R and Shi H and Gao T and Hu X and Zhao H and Yuan Q and Liu W and Yu Y},
  year = {2026},
  journal = {Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada},
  doi = {10.1093/mam/ozag086},
  url = {https://doi.org/10.1093/mam/ozag086}
}

RIS

TY  - JOUR
TI  - Room-Temperature FIB-Based TEM Specimen Preparation for Radiation-Sensitive Solid-State Electrolytes.
AU  - Hao R
AU  - Shi H
AU  - Gao T
AU  - Hu X
AU  - Zhao H
AU  - Yuan Q
AU  - Liu W
AU  - Yu Y
PY  - 2026
JO  - Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
DO  - 10.1093/mam/ozag086
UR  - https://doi.org/10.1093/mam/ozag086
ER  - 

APA

R, H., H, S., T, G., X, H., H, Z., Q, Y., W, L., & Y, Y. (2026). Room-Temperature FIB-Based TEM Specimen Preparation for Radiation-Sensitive Solid-State Electrolytes.. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. https://doi.org/10.1093/mam/ozag086

Source records