Preserving the Crystal Structure of Organic Semiconductors During Cross-Sectional Specimen Preparation for Transmission Electron Microscopy Using a Focused Ion Beam.
- DOI
- 10.1093/mam/ozag090
- Published
- 2026 Jul 1
- Container
- Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
- Publisher
- Not recorded
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1093/mam/ozag090,
title = {Preserving the Crystal Structure of Organic Semiconductors During Cross-Sectional Specimen Preparation for Transmission Electron Microscopy Using a Focused Ion Beam.},
author = {Hettler S and Zschieschang U and Klauk H and Peterlechner M and Eggeler YM},
year = {2026},
journal = {Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada},
doi = {10.1093/mam/ozag090},
url = {https://doi.org/10.1093/mam/ozag090}
}RIS
TY - JOUR TI - Preserving the Crystal Structure of Organic Semiconductors During Cross-Sectional Specimen Preparation for Transmission Electron Microscopy Using a Focused Ion Beam. AU - Hettler S AU - Zschieschang U AU - Klauk H AU - Peterlechner M AU - Eggeler YM PY - 2026 JO - Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada DO - 10.1093/mam/ozag090 UR - https://doi.org/10.1093/mam/ozag090 ER -
APA
S, H., U, Z., H, K., M, P., & YM, E. (2026). Preserving the Crystal Structure of Organic Semiconductors During Cross-Sectional Specimen Preparation for Transmission Electron Microscopy Using a Focused Ion Beam.. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. https://doi.org/10.1093/mam/ozag090
Source records
- pubmed · retrieved 2026-11-10T09:07:45.438Z