Fungal contamination patterns and surface material susceptibility in manufacturing environments.

Anthony N, Chan WC, Huang CH, Li JH, Chiu HH, Hung LY, Chen KC.

DOI: 10.1093/sumbio/qvaf029
Published: 2025-12-03
Container: Sustain Microbiol
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.1093/sumbio/qvaf029,
  title = {Fungal contamination patterns and surface material susceptibility in manufacturing environments.},
  author = {Anthony N and  Chan WC and  Huang CH and  Li JH and  Chiu HH and  Hung LY and  Chen KC.},
  year = {2025},
  journal = {Sustain Microbiol},
  doi = {10.1093/sumbio/qvaf029},
  url = {https://doi.org/10.1093/sumbio/qvaf029}
}

RIS

TY  - JOUR
TI  - Fungal contamination patterns and surface material susceptibility in manufacturing environments.
AU  - Anthony N
AU  -  Chan WC
AU  -  Huang CH
AU  -  Li JH
AU  -  Chiu HH
AU  -  Hung LY
AU  -  Chen KC.
PY  - 2025
JO  - Sustain Microbiol
DO  - 10.1093/sumbio/qvaf029
UR  - https://doi.org/10.1093/sumbio/qvaf029
ER  -

APA

N, A., WC, C., CH, H., JH, L., HH, C., LY, H., & KC., C. (2025). Fungal contamination patterns and surface material susceptibility in manufacturing environments.. Sustain Microbiol. https://doi.org/10.1093/sumbio/qvaf029

Source records

europe-pmc · retrieved 2026-09-26T20:07:11.036Z