Hierarchical Bayesian Generalized Linear Models for Predicting Stagonospora Nodorum Blotch in Winter Wheat. Part II: Validation, Yield Loss Quantification, and Fungicide Profitability

Vinicius C. Garnica, Angela R. Post, Peter S. Ojiambo

Open source

DOI
10.1094/phyto-03-26-0081-r
Published
2026-10-30
Container
Phytopathology®
Publisher
Scientific Societies
Open access
unknown

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BibTeX

@article{allodium:10.1094/phyto-03-26-0081-r,
  title = {Hierarchical Bayesian Generalized Linear Models for Predicting Stagonospora Nodorum Blotch in Winter Wheat. Part II: Validation, Yield Loss Quantification, and Fungicide Profitability},
  author = {Vinicius C. Garnica and Angela R. Post and Peter S. Ojiambo},
  year = {2026},
  journal = {Phytopathology®},
  doi = {10.1094/phyto-03-26-0081-r},
  url = {https://doi.org/10.1094/phyto-03-26-0081-r}
}

RIS

TY  - JOUR
TI  - Hierarchical Bayesian Generalized Linear Models for Predicting Stagonospora Nodorum Blotch in Winter Wheat. Part II: Validation, Yield Loss Quantification, and Fungicide Profitability
AU  - Vinicius C. Garnica
AU  - Angela R. Post
AU  - Peter S. Ojiambo
PY  - 2026
JO  - Phytopathology®
DO  - 10.1094/phyto-03-26-0081-r
UR  - https://doi.org/10.1094/phyto-03-26-0081-r
ER  - 

APA

Garnica, V. C., Post, A. R., & Ojiambo, P. S. (2026). Hierarchical Bayesian Generalized Linear Models for Predicting Stagonospora Nodorum Blotch in Winter Wheat. Part II: Validation, Yield Loss Quantification, and Fungicide Profitability. Phytopathology®. https://doi.org/10.1094/phyto-03-26-0081-r

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