A Bayesian Approach to Beam-Induced Motion Correction in Cryo-EM Single-Particle Analysis

Jasenko Zivanov, Takanori Nakane, Sjors H. W. Scheres

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DOI: 10.1101/384537
Published: 2018-08-03
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Publisher: openRxiv
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Cite this work

BibTeX

@article{allodium:10.1101/384537,
  title = {A Bayesian Approach to Beam-Induced Motion Correction in Cryo-EM Single-Particle Analysis},
  author = {Jasenko Zivanov and Takanori Nakane and Sjors H. W. Scheres},
  year = {2018},
  doi = {10.1101/384537},
  url = {https://doi.org/10.1101/384537}
}

RIS

TY  - JOUR
TI  - A Bayesian Approach to Beam-Induced Motion Correction in Cryo-EM Single-Particle Analysis
AU  - Jasenko Zivanov
AU  - Takanori Nakane
AU  - Sjors H. W. Scheres
PY  - 2018
DO  - 10.1101/384537
UR  - https://doi.org/10.1101/384537
ER  -

APA

Zivanov, J., Nakane, T., & Scheres, S. H. W. (2018). A Bayesian Approach to Beam-Induced Motion Correction in Cryo-EM Single-Particle Analysis. https://doi.org/10.1101/384537

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crossref · retrieved 2026-11-06T14:52:02.751Z