Optimizing Optomechanical Detection by Spatially Mapping and Masking Measurement Inefficiency

Youssef Tawfik, Shan Hao, Thomas P. Purdy

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DOI: 10.1103/3dxh-3415
Published: 2026-09-02
Container: Physical Review Letters
Publisher: American Physical Society (APS)
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1103/3dxh-3415,
  title = {Optimizing Optomechanical Detection by Spatially Mapping and Masking Measurement Inefficiency},
  author = {Youssef Tawfik and Shan Hao and Thomas P. Purdy},
  year = {2026},
  journal = {Physical Review Letters},
  doi = {10.1103/3dxh-3415},
  url = {https://doi.org/10.1103/3dxh-3415}
}

RIS

TY  - JOUR
TI  - Optimizing Optomechanical Detection by Spatially Mapping and Masking Measurement Inefficiency
AU  - Youssef Tawfik
AU  - Shan Hao
AU  - Thomas P. Purdy
PY  - 2026
JO  - Physical Review Letters
DO  - 10.1103/3dxh-3415
UR  - https://doi.org/10.1103/3dxh-3415
ER  -

APA

Tawfik, Y., Hao, S., & Purdy, T. P. (2026). Optimizing Optomechanical Detection by Spatially Mapping and Masking Measurement Inefficiency. Physical Review Letters. https://doi.org/10.1103/3dxh-3415

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crossref · retrieved 2026-09-25T07:44:28.012Z