Maximum-information photoelectron metrology

P. Hockett, C. Lux, M. Wollenhaupt, T. Baumert

Open source

DOI: 10.1103/physreva.92.013412
Published: 2015-07-13
Container: Physical Review A
Publisher: American Physical Society (APS)
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1103/physreva.92.013412,
  title = {Maximum-information photoelectron metrology},
  author = {P. Hockett and C. Lux and M. Wollenhaupt and T. Baumert},
  year = {2015},
  journal = {Physical Review A},
  doi = {10.1103/physreva.92.013412},
  url = {https://doi.org/10.1103/physreva.92.013412}
}

RIS

TY  - JOUR
TI  - Maximum-information photoelectron metrology
AU  - P. Hockett
AU  - C. Lux
AU  - M. Wollenhaupt
AU  - T. Baumert
PY  - 2015
JO  - Physical Review A
DO  - 10.1103/physreva.92.013412
UR  - https://doi.org/10.1103/physreva.92.013412
ER  -

APA

Hockett, P., Lux, C., Wollenhaupt, M., & Baumert, T. (2015). Maximum-information photoelectron metrology. Physical Review A. https://doi.org/10.1103/physreva.92.013412

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crossref · retrieved 2026-09-25T12:19:17.951Z